Dislocation evolution during plastic deformation: Equations vs. discrete dislocation dynamics study

Abstract

Equations for dislocation evolution bridge the gap between dislocation properties and continuum descriptions of plastic behavior of crystalline materials. Computer simulations can help us verify these evolution equations and find their fitting parameters. In this paper, we employ discrete dislocation dynamics to establish a continuum-based model for the evolution of the dislocation structure in polycrystalline thin films. Expressions are developed for the density of activated dislocation sources, as well as dislocation nucleation and annihilation rates. We demonstrate how size effect naturally enters the evolution equation. Good agreement between the simulation and the model results is obtained. The current approach is based on a two-dimensional discrete dislocation dynamics model, but can be extended to three-dimensional models.

References in corpus (3)

• Submicron plasticity: yield stress, dislocation avalanches, and velocity distribution
• Temperature Dependence of the Yield Strength of Aluminum Thin Films: Multiscale Modeling Approach
• Bauschinger Effect in Thin Metal Films: Discrete Dislocation Dynamics Study

Cited by in corpus (5)

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• Hardening and Strain Localisation in Helium-Ion-Implanted Tungsten
• High- and low-entropy layers in solids behind shock and ramp compression waves
• Identification of dislocation reaction kinetics in complex dislocation networks for continuum modeling using data-driven methods
• Controlled irradiation hardening of tungsten by cyclic recrystallization