MCDF-RCI predictions for structure and width of x-ray line of Al and Si
arXiv:1408.4688 · doi:10.1016/j.jqsrt.2014.08.009
Abstract
Multiconfiguration Dirac-Fock and Relativistic Configuration Interaction methods have been employed to predict the structure and the width of x-ray lines of Al and Si. The influences of electron correlation and inclusion of possible satellite contributions on spectra structure have been studied. The widths of and atomic levels of Al and Si have been also computed.
Accepted for publication in Journal of Quantitative Spectroscopy and Radiative Transfer