Physical limitations to the spatial resolution of solid-state detectors
arXiv:1404.4535 · doi:10.1109/TNS.2014.2376941
Abstract
In this paper we explore the effect of -ray emission, fluctuations in th e signal deposition on the detection of charged particles in silicon-based detec tors. We show that these two effects ultimately limit the resolution that can be achieved by interpolation of the signal in finely segmented position-sensitive solid-state devices.
5 pages