Trade-off between Linewidth and Slip Rate in a Mode-Locked Laser Model

Abstract

We demonstrate a trade-off between linewidth and loss-of-lock frequency in a mode-locked laser employing active feedback to control the carrier-envelope offset phase difference. In frequency metrology applications, the linewidth translates directly to uncertainty in the measured frequency, while the impact of lock loss and recovery on the measured frequency is less well understood. We reduce the dynamics to stochastic differential equations, specifically diffusion processes, and compare the linearized linewidth to the rate of lock loss determined by the mean time to exit calculated from large deviation theory.

5 pages, 4 figures

References in corpus (1)

• The quantum-limited comb lineshape of a mode-locked laser: Fundamental limits on frequency uncertainty

Cited by in corpus (3)

• The instanton method and its numerical implementation in fluid mechanics
• A primer on noise-induced transitions in applied dynamical systems
• Computation of minimum action paths of the stochastic nonlinear Schroedinger equation with dissipation