Multiple Ionization under Strong XUV to X-ray Radiation
arXiv:1401.4975 · doi:10.1140/epjst/e2013-01987-7
Abstract
We review the main aspects of multiple photoionization processes in atoms exposed to intense, short wavelength radiation. The main focus is the theoretical framework for the description of such processes as well as the conditions under which direct multiphoton multiple ionization processes can dominate over the sequential ones. We discuss in detail the mechanisms available in different wavelength ranges from the infrared to the hard X-rays. The effect of field fluctuations, present at this stage in all SASE free-electron-laser (FEL) facilities, as well as the effect of the interaction volume integration, are also discussed.
References in corpus (3)
Cited by in corpus (4)
- Atomic, molecular and optical physics applications of longitudinally coherent and narrow bandwidth Free-Electron Lasers
- Time-Dependent Density-Functional Theory of Strong-Field Ionization of Atoms under Soft X-Rays
- Theoretical study of electronic damage in single particle imaging experiments at XFELs for pulse durations 0.1 - 10 fs
- Revisiting Photon Statistics Effects on Multi-photon Ionization