Antipersistent behavior of defects in a lyotropic liquid crystal during annihilation

Abstract

We report on the dynamical behavior of defects of strength s = +/- 1/2 in a lyotropic liquid crystal during the annihilation process. By following their positions using time resolved polarizing microscopy technique, we present statistically significant evidence that the relative velocity between defect pairs is Gaussian distributed, anti-persistent and long-range correlated. We further show that simulations of the Lebwohl-Lasher model reproduce quite well our experimental findings.

Accepted for publication in PRE as Brief Report

References in corpus (4)

• Hydrodynamics of domain growth in nematic liquid crystals
• Defect kinetics and dynamics of pattern coarsening in a two-dimensional smectic-A system
• Dynamics of topological defects in a two-dimensional magnetic domain stripe pattern
• Dynamical Scaling In Two Dimensional Quenched Uniaxial Nematic Liquid Crystals