Invariant Criterion for the Design of Multiple Beam Profile Emittance and Twiss Parameters Measurement Sections
arXiv:1305.1526
Abstract
We introduce and give examples of applications of an optimality criterion which can be used for the design and comparison of multiple beam profile emittance and Twiss parameters measurement sections and which is independent from the position of the reconstruction point.
arXiv comment3 pages, IPAC13