Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair

Abstract

We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may be found from the same data. We demonstrate the technique by characterizing high harmonic radiation generated in a gas cell, however the method could be extended to a wide variety of light sources.

4 pages, 3 figures, 1 table

References in corpus (2)

• Generation of Spatially Coherent Light at Extreme Ultraviolet Wavelengths
• Order-dependent structure of High Harmonic Wavefronts

Cited by in corpus (2)

• Spectrally resolved single-shot wavefront sensing of broadband high-harmonic sources
• Gaussian-Schell analysis of the transverse spatial properties of high-harmonic beams