Coherent microscopy at resolution beyond diffraction limit using post-experimental data extrapolation

Abstract

Conventional microscopic records represent intensity distributions whereby local sample information is mapped onto local information at the detector. In coherent microscopy, the superposition principle of waves holds; field amplitudes are added, not intensities. This non-local representation is spread out in space and interference information combined with wave continuity allows extrapolation beyond the actual detected data. Established resolution criteria are thus circumvented and hidden object details can retrospectively be recovered from just a fraction of an interference pattern.

11 pages, 4 figures

References in corpus (5)

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Cited by in corpus (9)

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• Iterative phase retrieval in coherent diffractive imaging: practical issues
• Anisotropic nano-scale resolution in 3D Bragg coherent diffraction imaging
• Algorithms and image formation in orbital tomography
• Imaging outside the box: Resolution enhancement in X-ray coherent diffraction imaging by extrapolation of diffraction patterns
• Atomically resolved structural determination of graphene and its point defects via extrapolation assisted phase retrieval
• Resolution enhancement by extrapolation of coherent diffraction images: A quantitative study on the limits and a numerical study of non-binary and phase objects
• Phase retrieval methods applied to coherent imaging
• Far-field intensity signature of sub-wavelength microscopic objects