On circular Bragg regimes in ellipsometry spectra of ambichiral sculptured thin films

Abstract

The generalized ellipsometry formalism is used for a right handed ambichiral sculptured thin film.The amplitude ratios and phase differences of this structure are extracted from the amplitude transmission ratios. The results showed that the circular Bragg regimes appear with abruptly changes in ellipsometry spectrum as wavelength, where the selective circular transmission is maximized.

3 figures. arXiv admin note: substantial text overlap with arXiv:1206.0427

References in corpus (2)

• On Calibration of a Nominal Structure-Property Relationship Model for Chiral Sculptured Thin Films by Axial Transmittance Measurements
• On Percolation and Circular Bragg Phenomenon in Metallic, Helicoidally Periodic, Sculptured Thin Films

Cited by in corpus (1)

• Geometric Phase and Nanoscale Architected Morphology of Reusch Piles