Crystallographic refinement of collective excitations using standing wave inelastic x-ray scattering
arXiv:1205.5915 · doi:10.1016/j.chemphys.2012.06.018
Abstract
We propose a method for realizing true, real-space imaging of charge dynamics in a periodic system, with angstrom spatial resolution and attosecond time resolution. In this method, inelastic x-ray scattering (IXS) is carried out with a coherent, standing wave source, which provides the off-diagonal elements of the generalized dynamic structure factor, S(q_1,q_2,ω), allowing complete reconstruction of the inhomogeneous response function of the system, χ(x_1,x_2,t). The quantity χhas the physical meaning of a propagator for charge, so allows one to observe - in real time - the disturbance in the electron density created by a point source placed at a specified location, x_1 (on an atom vs. between atoms, for example). This method may be thought of as a generalization of x-ray crystallography that allows refinement of the excited states of a periodic system, rather than just its ground state.
28 pages, 8 figures, submitted to Chemical Physics
References in corpus (1)
Cited by in corpus (4)
- Measurement of the dynamic charge response of materials using low-energy, momentum-resolved electron energy-loss spectroscopy (M-EELS)
- Theory of time-resolved non-resonant x-ray scattering for imaging ultrafast coherent electron motion
- Real-Space Visualization of Remnant Mott Gap and Magnon Excitations
- Theory of high-energy correlated multiphoton x-ray diffraction for synchrotron radiation sources