Mass-loading induced dephasing in nanomechanical resonators

Abstract

I study dephasing of an underdamped nanomechanical resonator subject to random mass loading of small particles. I present a frequency noise model which describes dephasing due to attachment and detachment of particles at random points and particle diffusion along the resonator. This situation is commonly encountered in current mass measurement experiments using NEM resonators. I discuss the conditions which can lead to inhomogeneous broadening and fine structure in the modes absorption spectra. I also show that the spectra of the higher order cumulants of the (complex) vibrational mode amplitude are sensitive to the parameters characterizing the frequency noise process. Hence, measurement of these cumulants can provide information not only about the mass but also about other parameters of the particles (diffusion coefficient and attachment-detachment rates.)

7 pages, 4 figures

References in corpus (7)

• A Mechanical Mass Sensor with Yoctogram Resolution
• Strong coupling between single-electron tunneling and nano-mechanical motion
• Carbon nanotubes as ultra-high quality factor mechanical resonators
• Nonlinear modal interactions in clamped-clamped mechanical resonators
• Digital and FM demodulation of a doubly-clamped single wall carbon nanotube oscillator: towards a nanotube cell phone
• Frequency and phase noise of ultra-high Q silicon nitride nanomechanical resonators
• High-frequency nanotube mechanical resonators