Multiscaling analysis of ferroelectric domain wall roughness

Abstract

Using multiscaling analysis, we compare the characteristic roughening of ferroelectric domain walls in PZT thin films with numerical simulations of weakly pinned one-dimensional interfaces. Although at length scales up to a length scale greater or equal to 5 microns the ferroelectric domain walls behave similarly to the numerical interfaces, showing a simple mono-affine scaling (with a well-defined roughness exponent), we demonstrate more complex scaling at higher length scales, making the walls globally multi-affine (varying roughness exponent at different observation length scales). The dominant contributions to this multi-affine scaling appear to be very localized variations in the disorder potential, possibly related to dislocation defects present in the substrate.

5 pages, 4 figures

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• Domain Wall Roughness in Stripe Phase BiFeO${}_3$ Thin Films
• From bulk descriptions to emergent interfaces: connecting the Ginzburg-Landau and elastic line models
• Uniqueness of the thermodynamic limit for driven disordered elastic interfaces
• A numerical study of the statistics of roughness parameters for fluctuating interfaces
• Segmental front line dynamics of randomly pinned ferroelastic domain walls
• Non-Gaussian tail in the force distribution: A hallmark of correlated disorder in the host media of elastic objects
• Dynamic response and roughening of ferroelectric domain walls driven at planar electrode edges
• Distinct scaling behaviors of giant electrocaloric cooling performance in low-dimensional organic, relaxor and anti-ferroelectrics
• Multifractal scaling of flux penetration in the Iron-based Superconductor Ba(Fe${}_{0.93}$Co${}_{0.07}$)${}_2$As${}_2$