Rule-based Test Generation with Mind Maps
arXiv:1202.6125 · doi:10.4204/EPTCS.80.8
Abstract
This paper introduces basic concepts of rule based test generation with mind maps, and reports experiences learned from industrial application of this technique in the domain of smart card testing by Giesecke & Devrient GmbH over the last years. It describes the formalization of test selection criteria used by our test generator, our test generation architecture and test generation framework.
In Proceedings MBT 2012, arXiv:1202.5826