The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy
arXiv:1202.5217 · doi:10.1088/0957-4484/23/26/265705
Abstract
Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation, or the frequency mixing of multiple drive tones by the nonlinear tip-surface force, can be used to concentrate the nonlinear motion in a narrow band of frequency near the cantilevers fundamental resonance, where accuracy and sensitivity of force measurement are greatest. Two different methods for reconstructing tip-surface forces from intermodulation spectra are explained. The reconstruction of both conservative and dissipative tip-surface interactions from intermodulation spectra are demonstrated on simulated data.
25 pages (preprint, double space) 7 figures
References in corpus (4)
Cited by in corpus (6)
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- Reconstruction of Tip-Surface Interactions with Multimodal Intermodulation Atomic Force Microscopy
- Interpreting motion and force for narrow-band intermodulation atomic force microscopy
- On modeling and measuring viscoelasticity with dynamic Atomic Force Microscopy
- Steady-state and transient behavior in dynamic atomic force microscopy