Vector Reflectometry in a Beam Waveguide

Abstract

We present a one-port calibration technique for characterization of beam waveguide components with a vector network analyzer. This technique involves using a set of known delays to separate the responses of the instrument and the device under test. We demonstrate this technique by measuring the reflected performance of a millimeter-wave variable-delay polarization modulator.

References in corpus (2)

• Properties of a Variable-delay Polarization Modulator
• The Hertz/VPM polarimeter: Design and first light observations

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