A Simple Model to Measure Linewidth Enhancement Factor (α) for Multi-wavelengths Semiconductor Laser
arXiv:1106.3676
Abstract
A novel and simple model is proposed for the measurement of the linewidth enhancement factor (LEF) α of multiwavelengths semiconductor laser. It is based on the suppression characteristics of an arbitrary mode while other modes are optically injection locked individually. The proposed model can be used to measure α value of individual modes of multi-wavelengths laser with large mode spacing. As a proof of the concept, the model is used to experimentally measure α of a mode of a slotted Fabry- Pérot laser source.