Verifying entanglement in the Hong-Ou-Mandel dip
arXiv:1101.0846 · doi:10.1103/PhysRevA.83.042318
Abstract
The Hong-Ou-Mandel interference dip is caused by an entangled state, a delocalized bi-photon state. We propose a method of detecting this entanglement by utilizing inverse Hong-Ou-Mandel interference, while taking into account vacuum and multi-photon contaminations, phase noise, and other imperfections. The method uses just linear optics and photodetectors, and for single-mode photodetectors we find a lower bound on the amount of entanglement.
5 pages, 2 figures