Determination of critical current density from arbitrary flux relaxation process

Abstract

The current-carrying ability of a type-II superconductor is generally represented by its critical current density. This can be determined by measuring a flux relaxation process starting with a testing current density that is greater than or equal to the critical value. Here we show that a flux relaxation process starting with an intermediate current density can be converted into a process starting with the critical current density by introducing a virtual time interval. Therefore, one may calculate the critical current density from the flux relaxation process starting with a current density below the critical value. The exact solutions of the time dependence of current density in the flux relaxation process were also discussed.

5 pages

References in corpus (4)

• Extreme vortex pinning in the non-centrosymmetric superconductor CePt${}_3$Si
• Mathematical model of flux relaxation phenomenon
• Quantum vortex tunneling in $YB{a}_{2}C{u}_3{O}_{7-\delta }$ thin films
• Vortex penetration and flux relaxation with arbitrary initial conditions in non-ideal and ideal superconductors