Capacitively Enhanced Thermal Escape in Underdamped Josephson Junctions
arXiv:1012.0541 · doi:10.1007/s10909-011-0344-2
Abstract
We have studied experimentally the escape dynamics in underdamped capacitively shunted and unshunted Josephson junctions with submicroampere critical currents below 0.5 K temperatures. In the shunted junctions, thermal activation process was preserved up to the highest temperature where the escape in the unshunted junctions exhibits the phase diffusion. Our observations in the shunted junctions are in good agreement with the standard thermal activation escape, unlike the results in the unshunted junctions.
4 pages, 3 figures
References in corpus (3)
- Experimental determination of the Berry phase in a superconducting charge pump
- Measurement of the effect of quantum phase-slips in a Josephson Junction chain
- Thermal fluctuations in moderately damped Josephson junctions: Multiple escape and retrapping, switching- and return-current distributions and hysteresis