Quantum interference effects in a system of two tunnel point-contacts in the presence of single scatterer: simulation of a double-tip STM experiment
arXiv:1011.6155 · doi:10.1063/1.3551531
Abstract
The conductance of systems containing two tunnel point-contacts and a single subsurface scatterer is investigated theoretically. The problem is solved in the approximation of s-wave scattering giving analytical expressions for the wave functions and for the conductance of the system. Conductance oscillations resulting from the interference of electron waves passing through different contacts and their interference with the waves scattered by the defect are analyzed. The prospect for determining the depth of the impurity below the metal surface by using the dependence of the conductance as a function of the distance between the contacts is discussed. It is shown that the application of an external magnetic field results in Aharonov-Bohm type oscillations in the conductance, the period of which allows detection of the depth of the defect in a double tip STM experiment.
11 pages, 4 figures, to be published in Fiz. Nizk. Temp. (Low Temp. Phys.), V.37, No.1 (2011) corrected figures
References in corpus (6)
- Method to determine defect positions below a metal surface by STM
- Signature of Fermi surface anisotropy in point contact conductance in the presence of defects
- Aharonov-Bohm oscillations in the local density of states
- Theory of oscillations in the STM conductance resulting from subsurface defects (Review Article)
- Conductance of a tunnel point-contact of noble metals in the presence of a single defect
- The signature of subsurface Kondo impurities in the local tunnel current
Cited by in corpus (5)
- Detection of electronic nematicity using scanning tunneling microscopy
- Fabrication of on-chip probes for double-tip scanning tunneling microscopy
- Nanofabricated tips for device-based scanning tunneling microscopy
- Modeling Green's functions measurements with two-tip scanning tunneling microscopy
- Conductance of a STM contact on the surface of a thin film