On the characterization of a random monolayer of particles from coherent optical reflectance

Abstract

We present the viability of obtaining the particle size and surface coverage in a monolayer of polystyrene particles adsorbed on a glass surface from optical coherent reflectance data around the critical angle in an internal reflection configuration. We have found that fitting a CSM to optical reflectivity curves in an internal reflection configuration around the critical angle with a dilute random monolayer of particles adsorbed on the surface can in fact provide the particle's radius and surface coverage once the particles are sufficiently large.

Conference Date: Sunday 24 May 2009 Conference Location: Quebec, Canada Conference Title: Photonics North 2009 Conference Chairs: Real Vallee