On Using Magnetic and optical methods to determine the size and characteristics of nanoparticles embedded in oxide semiconductors
arXiv:1001.2674 · doi:10.1109/TMAG.2010.2041196
Abstract
Films of oxides doped with transition metals are frequently believed to have magnetic inclusions. Magnetic methods to determine the amount of nanophases and their magnetic characteristics are described. The amount of the sample that is paramagnetic may also be measured. Optical methods are described and shown to be very powerful to determine which defects are also magnetic.
Manuscript of poster to be presented at MMM-Intermag 2010. Accepted for publication in Magnetic Trans of IEEE
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