Aging of poled ferroelectric ceramics due to relaxation of random depolarization fields by space-charge accumulation near grain boundaries

Abstract

Migration of charged point defects triggered by the local random depolarization field is shown to plausibly explain aging of poled ferroelectric ceramics providing reasonable time and acceptor concentration dependences of the emerging internal bias field. The theory is based on the evaluation of the energy of the local depolarization field caused by mismatch of the polarizations of neighbor grains. The kinetics of charge migration assumes presence of mobile oxygen vacancies in the material due to the intentional or unintentional acceptor doping. Satisfactory agreement of the theory with experiment on the Fe-doped lead zirconate titanate is demonstrated.

arXiv commenttheory and experiment, 22 pages, 3 figures

References in corpus (2)

• Drift of charged defects in local fields as aging mechanism in ferroelectrics
• Space-charge mechanism of aging in ferroelectrics: an exactly solvable two-dimensional model

Cited by in corpus (4)

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• Ferroelectric Polycrystals: Structural and microstructural levers for property engineering via domain-wall dynamics
• Surface potential at a ferroelectric grain due to asymmetric screening of depolarization fields
• Domain Wall Acceleration by Ultrafast Field Application: An Ab Initio-Based Molecular Dynamics Study