Phase imaging with intermodulation atomic force microscopy

Abstract

Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which mixes the drive tones and generates new frequency components in the cantilever response known as intermodulation products (IMPs). We present a procedure for extracting the phase at each IMP and demonstrate phase images made by recording this phase while scanning. Amplitude and phase images at intermodulation frequencies exhibit enhanced topographic and material contrast.

6 pages, 6 pages

References in corpus (1)

• The Band Excitation Method in Scanning Probe Microscopy for Rapid Mapping of Energy Dissipation on the Nanoscale

Cited by in corpus (4)

• The Intermodulation Lockin Analyzer
• Interpreting motion and force for narrow-band intermodulation atomic force microscopy
• Medium Amplitude Parallel Superposition (MAPS) Rheology, Part 2: Experimental Protocols and Data Analysis
• Effect of material stiffness on intermodulation response in dynamic atomic force microscopy