Preparation of Cobalt Thin Films by Sputtering Systems and Its Magnetic Characterization
arXiv:0910.5452
Abstract
Different thicknesses of cobalt thin films were growth by magnetron sputtering deposition techniques. The films thicknesses were determinated with X ray Photoelectron Spectroscopy (XPS) and Quartz Crystal Monitoring (QCM). XPS is also used to determinate the films quality. The films magnetic properties were determinated by Ferromagnetic Resonance (FMR) technique.
14 pages, 6 figures