Magnetic resonance spectroscopy of single centers in silicon quantum wells
arXiv:0910.3864 · doi:10.1016/j.physb.2009.08.248
Abstract
We present the new optically-detected magnetic resonance (ODMR) technique which reveals single point defects in silicon quantum wells embedded in microcavities within frameworks of the excitonic normal-mode coupling (NMC) without the external cavity and the hf source.
arXiv comment8 pages, 7 figures