paper

Tuning of electron transport through a moebius strip: shot noise

arXiv:0910.1218 · doi:10.1016/j.ssc.2007.03.013

Abstract

We explore electron transport through a moebius strip attached to two metallic electrodes by the use of Green's function technique. A parametric approach is used based on the tight-binding model to characterize the electron transport through such a bridge system and it is observed that the transport properties are significantly affected by (a) the transverse hopping strength between the two channels and (b) the strip-to-electrode coupling strength. In this context we also describe the noise power of the current fluctuations that provides a key information about the electron correlation which is obtained by calculating the Fano factor (). The knowledge of this current fluctuations gives important ideas for fabrication of efficient electronic devices.

arXiv comment9 pages, 8 figures

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