Thickness-induced insufficient oxygen reduction in La(2-x)CexCuO4 thin films

Abstract

A series of electron-doped cuprate La(2-x)CexCuO4 thin films with different thicknesses have been fabricated and their annealing time are adjusted carefully to ensure the highest superconducting transition temperature. The transport measurements indicate that, with the increase of the film thickness (<100 nm), the residual resistivity increases and the Hall coefficient shifts in the negative direction. Further more, the X-ray diffraction data reveal that the c-axis lattice constant c0 increases with the decrease of film thickness. These abnormal phenomena can be attributed to the insufficient oxygen reduction in the thin films. Considering the lattice mismatching in the ab-plane between the SrTiO3 substrates and the films, the compressive stress from the substrates may be responsible for the more difficult reduction of the oxygen in the thin films.

4 pages, 4 figures

References in corpus (4)

• Effect of disorder outside the CuO${}_2$ planes on $T_c$ of copper oxide superconductors
• Microscopic annealing process and its impact on superconductivity in T'-structure electron-doped copper oxides
• Role of oxygen in the electron-doped superconducting cuprates
• Coexistence of Superconductivity and Ferromagnetism in Dilute Co-doped $La_{1.89} Ce_{0.11} Cu O_{4\pm\d}$ System

Cited by in corpus (2)

• Transport anomalies and quantum criticality in electron-doped cuprate superconductors
• Sign reversal of the Hall resistance in the mixed-state of La${}_{1.89}$ Ce${}_{0.11}$CuO${}_4$ and La${}_{1.89}$Ce${}_{0.11}$(Cu${}_{0.99}$Co${}_{0.01}$)O${}_4$ thin films