Hierarchy of Electronic Properties of Chemically Derived and Pristine Graphene Probed by Microwave Imaging
arXiv:0908.1778 · doi:10.1021/nl901949z
Abstract
Local electrical imaging using microwave impedance microscope is performed on graphene in different modalities, yielding a rich hierarchy of the local conductivity. The low-conductivity graphite oxide and its derivatives show significant electronic inhomogeneity. For the conductive chemical graphene, the residual defects lead to a systematic reduction of the microwave signals. In contrast, the signals on pristine graphene agree well with a lumped-element circuit model. The local impedance information can also be used to verify the electrical contact between overlapped graphene pieces.
12 pages, 4 figures. submitted to Nano Letters
References in corpus (10)
- Electric Field Effect in Atomically Thin Carbon Films
- Highly Conducting Graphene Sheets and Langmuir-Blodgett Films
- Observation of Electron-Hole Puddles in Graphene Using a Scanning Single Electron Transistor
- Spin qubits in graphene quantum dots
- Operation of Graphene Transistors at GHz Frequencies
- High-Resolution Scanning Tunneling Microscopy Imaging of Mesoscopic Graphene Sheets on an Insulating Surface
- Giant Phonon-induced Conductance in Scanning Tunneling Spectroscopy of Gate-tunable Graphene
- Modeling of a Cantilever-Based Near-Field Scanning Microwave Microscope
- AFM-compatible near-field scanning microwave microscope with separated excitation and sensing probes
- Nanoscale Electronic Inhomogeneity in In2Se3 Nanoribbons Revealed by Microwave Impedance Microscopy
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