Imaging of order parameter induced phase shifts in cuprate superconductors by low-temperature scanning electron microscopy
arXiv:0908.0490 · doi:10.1103/PhysRevLett.103.067011
Abstract
Low-temperature scanning electron microscopy (LTSEM) has been used to image the supercurrent distribution in ramp-type Josephson junctions between Nb and either the electron-doped cuprate NdCeCuO or the hole-doped cuprate YBaCuO. For zigzag-shaped devices in the short junction limit the critical current is strongly suppressed at zero applied magnetic field. The LTSEM images show, that this is due to the Josephson current counterflow in neighboring 0 and facets, which is induced by the order parameter in the cuprates. Thus, LTSEM provides imaging of the sign change of the superconducting order parameter, which can also be applied to other types of Josephson junctions.
4 pages, 3 figures
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Cited by in corpus (8)
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- Phase-sensitive evidence for dx2-y2-pairing symmetry in the parent-structure high-Tc cuprate superconductor Sr1-xLaxCuO2
- Magnetic field dependence of the critical current in YBa_2Cu_3O_{7-δ}/Au/Nb ramp-zigzag Josephson junctions
- Fractional vortex in asymmetric 0- long Josephson junctions
- Manifestation of the magnetic moments of Cooper pairs in low-temperature properties of superconducting thin-film rings
- Breathing modes of long Josephson junctions with phase-shifts