Evaluation of the optical axis tilt of Zinc oxide films via noncollinear second harmonic generation

Abstract

We investigated noncollinear second harmonic generation form Zinc oxide films, grown on glass substrates by dual ion beam sputtering technique. At a fixed incidence angle, the generated signal is investigated by scanning the polarization state of both fundamental beams. We show that the map of the generated signal as a function of polarization states of both pump beams, together with the analytical curves, allows to retrieve the orientation of the optical axis and, eventually, its angular tilt, with respect to the surface normal

arXiv commentTo appear on Appl. Phys. Lett