Ionization and charge migration through strong internal fields in clusters exposed to intense X-ray pulses
arXiv:0902.3940 · doi:10.1103/PhysRevA.79.041201
Abstract
A general scenario for electronic charge migration in finite samples illuminated by an intense laser pulse is given. Microscopic calculations for neon clusters under strong short pulses as produced by X-ray free-electron laser sources confirm this scenario and point to the prominent role of field ionization by strong internal fields. The latter leads to the fast formation of a core-shell system with an almost static core of screened ions while the outer shell explodes. Substituting the shell ions with a different material such as helium as a sacrificial layer leads to a substantial improvement of the diffraction image for the embedded cluster thus reducing the consequences of radiation damage for coherent diffractive imaging.
5 pages, 4 figures
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- Calculation of x-ray scattering patterns from nanocrystals at high x-ray intensity
- Proton ejection from molecular hydride clusters exposed to strong X-ray pulses
- Augmented collisional ionization via excited states in XUV cluster interactions
- A molecular-dynamics approach for studying the non-equilibrium behavior of x-ray-heated solid-density matter
- Clusters in Intense XUV pulses: effects of cluster size on expansion dynamics and ionization
- Long-lasting XUV activation of helium nanodroplets for avalanche ionization
- Slow electrons from clusters in strong Xray pulses