Transport, magnetic, and structural properties of LaCeMnO thin films. Evidence for hole-doping
arXiv:0811.4710 · doi:10.1103/PhysRevB.79.054416
Abstract
Cerium-doped manganite thin films were grown epitaxially by pulsed laser deposition at C and oxygen pressure Pa and were subjected to different annealing steps. According to x-ray diffraction (XRD) data, the formation of CeO as a secondary phase could be avoided for Pa. However, transmission electron microscopy shows the presence of CeO nanoclusters, even in those films which appear to be single phase in XRD. With O annealing, the metal-to-insulator transition temperature increases, while the saturation magnetization decreases and stays well below the theoretical value for electron-doped LaCeMnO with mixed Mn/Mn valences. The same trend is observed with decreasing film thickness from 100 to 20 nm, indicating a higher oxygen content for thinner films. Hall measurements on a film which shows a metal-to-insulator transition clearly reveal holes as dominating charge carriers. Combining data from x-ray photoemission spectroscopy, for determination of the oxygen content, and x-ray absorption spectroscopy (XAS), for determination of the hole concentration and cation valences, we find that with increasing oxygen content the hole concentration increases and Mn valences are shifted from 2+ to 4+. The dominating Mn valences in the films are Mn and Mn, and only a small amount of Mn ions can be observed by XAS. Mn and Ce XAS signals obtained in surface-sensitive total electron yield mode are strongly reduced in the bulk-sensitive fluorescence mode, which indicates hole-doping in the bulk for those films which do show a metal-to-insulator transition.
arXiv comment8 pages, 10 figures
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