Trap Distribution and the Impact of Oxygen-induced Traps on the Charge Transport in Poly(3-Hexylthiophene)
arXiv:0810.3534 · doi:10.1063/1.2978237
Abstract
The trap distribution in the conjugated polymer poly(3-hexylthiophene) was investigated by fractional thermally stimulated current measurements. Two defect states with activation energies of about 50 meV and 105 meV and Gaussian energy distributions were revealed. The first is assigned to the tail of the intrinsic density of states, whereas the concentration of second trap is directly related to oxygen exposure. The impact of the oxygen induced traps on the charge transport was examined by performing photo-induced charge carrier extraction by linearly increasing voltage measurements, that exhibited a strong decrease in the mobility with air exposure time.
4 pages, 3 figures, 2 tables
Cited by in corpus (4)
- Oxygen doping of P3HT:PCBM blends: Influence on trap states, charge carrier mobility and solar cell performance
- Nongeminate recombination in neat P3HT and P3HT:PCBM blend films
- Electronic Trap States in Methanofullerenes
- Investigation of electronic trap states in organic photovoltaic materials by current-based deep level transient spectroscopy