Photovoltage Dynamics of the Hydroxylated Si(111) Surface Investigated by Ultrafast Electron Diffraction

Abstract

We present a novel method to measure transient photovoltage at nanointerfaces using ultrafast electron diffraction. In particular, we report our results on the photoinduced electronic excitations and their ensuing relaxations in a hydroxyl-terminated silicon surface, a standard substrate for fabricating molecular electronics interfaces. The transient surface voltage is determined by observing Coulomb refraction changes induced by the modified space-charge barrier within a selectively probed volume by femtosecond electron pulses. The results are in agreement with ultrafast photoemission studies of surface state charging, suggesting a charge relaxation mechanism closely coupled to the carrier dynamics near the surface that can be described by a drift-diffusion model. This study demonstrates a newly implemented ultrafast diffraction method for investigating interfacial processes, with both charge and structure resolution.

arXiv comment5 pages, 5 figures

References in corpus (2)

• Electrostatic potential profiles of molecular conductors
• Dynamics of Size-Selected Gold Nanoparticles Studied by Ultrafast Electron Nanocrystallography

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