Direct evidence for the suppression of charge stripes in epitaxial La${}_{1.67}$Sr${}_{0.33}$NiO${}_4$ thin films

Abstract

We have successfully grown epitaxial La${}_{1.67}$Sr${}_{0.33}$NiO${}_4$ films with a small crystalline mosaic using pulsed laser deposition. With synchrotron radiation, the x-ray diffraction peaks associated with charge stripes have been successfully observed for relatively thick films. Anomalies due to the charge-ordering transition have been examined using four-point probe resistivity measurements. X-ray scattering provides direct evidence for suppression of the stripe phase in thin samples; the phase disappears for film thicknesses $⩽$ 2600 ~Å. The suppression appears to be a result of shrinking the stripe phase domains. This may reflect the stripe phase progressing from nematic to isotropic.

arXiv comment5 pages, 4 figures

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