Precise half-life measurement of the 26Si ground state
arXiv:0801.4125 · doi:10.1140/epja/i2008-10623-5 10.1140/epja/i2008-10678-2
Abstract
The beta-decay half-life of 26Si was measured with a relative precision of 1.4*10e3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision similar to the previously reported measurements. The experiment was done at the Accelerator Laboratory of the University of Jyvaskyla where we used the IGISOL technique with the JYFLTRAP facility to separate pure samples of 26Si.
arXiv comment8 pages, 7 figures; accepted by EPJA
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Cited by in corpus (3)
- Superallowed 0+ to 0+ nuclear beta decays: A new survey with precision tests of the conserved vector current hypothesis and the standard model
- Superallowed 0+ --> 0+ nuclear beta decays: 2014 critical survey, with precise results for Vud and CKM unitarity
- Precise Half-Life Measurement of the Superallowed Beta+ Emitter 26Si