Specification Test Compaction for Analog Circuits and MEMS

Abstract

Testing a non-digital integrated system against all of its specifications can be quite expensive due to the elaborate test application and measurement setup required. We propose to eliminate redundant tests by employing e-SVM based statistical learning. Application of the proposed methodology to an operational amplifier and a MEMS accelerometer reveal that redundant tests can be statistically identified from a complete set of specification-based tests with negligible error. Specifically, after eliminating five of eleven specification-based tests for an operational amplifier, the defect escape and yield loss is small at 0.6% and 0.9%, respectively. For the accelerometer, defect escape of 0.2% and yield loss of 0.1% occurs when the hot and colt tests are eliminated. For the accelerometer, this level of Compaction would reduce test cost by more than half.

arXiv commentSubmitted on behalf of EDAA (http://www.edaa.com/)