Strong reduction of field-dependent microwave surface resistance in YBaCuO with sub-micrometric BaZrO inclusions
arXiv:0710.1754 · doi:10.1063/1.2803856
Abstract
We observe a strong reduction of the field induced thin film surface resistance measured at high microwave frequency (47.7 GHz) in YBaCuO thin films grown on SrTiO substrates, as a consequence of the introduction of sub-micrometric BaZrO particles. The field increase of the surface resistance is smaller by a factor of 3 in the film with BaZrO inclusions, while the zero-field properties are not much affected. Combining surface resistance and surface reactance data we conclude (a) that BaZrO inclusions determine very deep and steep pinning wells and (b) that the pinning changes nature with respect to the pure film.
arXiv commentRevTeX; 4 pages, 3 figures; submitted to Applied Physics Letters
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