Further progress in ion back-flow reduction with patterned gaseous hole-multipliers

Abstract

A new idea on electrostatic deviation and capture of back-drifting avalanche-ions in cascaded gaseous hole-multipliers is presented. It involves a flipped reversed-bias Micro-Hole & Strip Plate (F-R-MHSP) element, the strips of which are facing the drift region of the multiplier. The ions, originating from successive multiplication stages, are efficiently deviated and captured by such electrode. Experimental results are provided comparing the ion-blocking capability of the F-R-MHSP to that of the reversed-bias Micro-Hole & Strip Plate (R-MHSP) and the Gas Electron Multiplier (GEM). Best ion-blocking results in cascaded hole-multipliers were reached with a detector having the F-R-MHSP as the first multiplication element. A three-element F-R-MHSP/GEM/MHSP cascaded multiplier operated in atmospheric-pressure Ar/CH4 (95/5), at total gain of ~10^{5}, yielded ion back-flow fractions of 3*10^{-4} and 1.5*10^{-4}, at drift fields of 0.5 and 0.2 kV/cm, respectively. We describe the F-R-MHSP concept and the relevance of the obtained ion back-flow fractions to various applications; further ideas are also discussed.

17 pages, 11 figures, published in JINST

References in corpus (8)

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• Study of ion feedback in multi-GEM structures
• Ion-induced effects in GEM & GEM/MHSP gaseous photomultipliers for the UV and the visible spectral range
• Charge Transfer and Charge Broadening of GEM Structures in High Magnetic Fields
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• Electric and Photoelectric Gates for ion backflow suppression in multi-GEM structures
• MHSP in reversed-biased operation mode for ion blocking in gas-avalanche multipliers
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