Modelling Thickness-Dependence of Ferroelectric Thin Film Properties
arXiv:0704.2752 · doi:10.1103/PhysRevB.76.014112
Abstract
We present a segregrated strain model that describes the thickness-dependent dielectric properties of ferroelectric films. Using a phenomenological Landau approach, we present results for two specific materials, making comparison with experiment and with first-principles calculations whenever possible. We also suggest a "smoking gun" benchtop probe to test our elastic scenario.
arXiv comment13 pages, 17 figures
References in corpus (6)
- Physics of thin-film ferroelectric oxides
- Ferroelectricity and tetragonality in ultrathin PbTiO3 films
- Strain Gradients in Epitaxial Ferroelectrics
- Tunability of the dielectric response of epitaxially strained SrTiO3 from first principles
- Smearing of phase transition due to a surface effect or a bulk inhomogeneity in ferroelectric nanostructures
- First-principles study of symmetry lowering in relaxed BaTiO3/SrTiO3 superlattices