Surface Structure Analysis of Atomically Smooth BaBiO${}_3$ Films

Abstract

Using low energy Time-of-Flight Scattering and Recoil Spectroscopy (TOF-SARS) and Mass Spectroscopy of Recoiled Ions (MSRI) we analyze the surface structure of an atomically smooth BaBiO${}_3$ film grown by molecular beam epitaxy. We demonstrate high sensitivity of the TOF-SARS and MSRI spectra to slight changes in the orientation of the ion scattering plane with respect to the crystallographic axes. The observed angle dependence allows us to clearly identify the termination layer as BiO${}_2$. Our data also indicate that angle-resolved MSRI data can be used for high resolution studies of surface structure of complex oxide thin films.

5 pages, 4 figures accepted for publication in Physical Review B

References in corpus (2)

• Fcc breathing instability in BaBiO_3 from first principles
• Non-cubic layered structure of Ba(1-x)K(x)BiO3 superconductor

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• Modulated electronic configurations in selectively doped multilayered nanostructures
• Epitaxial Growth of Perovskite SrBiO${}_3$ Film on SrTiO${}_3$ by Oxide Molecular Beam Epitaxy
• Unexpected Termination Switching and Polarity Compensation in LaAlO3/SrTiO3 heterostructures
• Superconducting junctions from non-superconducting doped CuO${}_2$ layers
• Polarons formation in Bi-deficient BaBiO${}_3$
• Comment on "Evidence for absence of metallic surface states in BiO2-terminated BaBiO3 thin films"