Temporal Evolution of Step-Edge Fluctuations Under Electromigration Conditions

Abstract

The temporal evolution of step-edge fluctuations under electromigration conditions is analysed using a continuum Langevin model. If the electromigration driving force acts in the step up/down direction, and step-edge diffusion is the dominant mass-transport mechanism, we find that significant deviations from the usual $t^{1/4}$ scaling of the terrace-width correlation function occurs for a critical time $\tau$ which is dependent upon the three energy scales in the problem: $k_{B}T$, the step stiffness, $\gamma$, and the bias associated with adatom hopping under the influence of an electromigration force, $\pm \Delta U$. For ($t<\tau$), the correlation function evolves as a superposition of $t^{1/4}$ and $t^{3/4}$ power laws. For $t\ge \tau$ a closed form expression can be derived. This behavior is confirmed by a Monte-Carlo simulation using a discrete model of the step dynamics. It is proposed that the magnitude of the electromigration force acting upon an atom at a step-edge can by estimated by a careful analysis of the statistical properties of step-edge fluctuations on the appropriate time-scale.

7 pages, 5 figures

References in corpus (1)

• A unified treatment of current-induced instabilities on Si surfaces