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Cornell High Energy Synchrotron Source

41 papers here1.7k citations across 41
fields
  • cond-mat.mtrl-sci19
  • cond-mat.str-el8
  • physics.ins-det6
  • cond-mat.mes-hall2
  • physics.app-ph2
  • cond-mat1
  • cond-mat.supr-con1
  • physics.optics1
ROR 032bgnz47OpenAlex

affiliations via OpenAlex

output
19992026
most citedHigh Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy

498 citations

researchers with a paper here
  • A. Woll8 · h 30
  • S. Gruner7 · h 73
  • J. Ruff3 profiles6 · h 18
  • M. Tate6 · h 37
  • E. Arenholz5 · h 57
  • H. Philipp5 · h 20
  • J. Brock5 · h 27
  • K. Shanks5 · h 12
  • P. Purohit5 · h 10
  • P. Shafer4 · h 36
  • D. Chamberlain3 · h 8
  • K. Finkelstein3 · h 27
collaborating institutions
  • Cornell UniversityUS41 papers
  • Lawrence Berkeley National LaboratoryUS6 papers
  • Advanced Photon Source5 papers
  • Argonne National LaboratoryUS5 papers
  • Advanced Light Source4 papers
  • University of California, Santa BarbaraUS3 papers
  • University of VermontUS3 papers
  • Chinese Academy of SciencesCN2 papers
  • Colorado School of MinesUS2 papers
  • Florida State UniversityUS2 papers
  • Institute of PhysicsPL2 papers
  • Los Alamos National LaboratoryUS2 papers
Showing 2014 · cond-mat.mtrl-sciShow all

1 paper · 2 filters

cond-mat.mtrl-sci2014★ 24 cited

Complex oxide growth using simultaneous in situ RHEED and x-ray reflectivity: When is one layer complete?

M. C. Sullivan, M. J. Ward, Araceli Gutierrez-Llorente +4

During layer-by-layer homoepitaxial growth, both the Reflection High-Energy Electron Diffraction (RHEED) intensity and the x-ray reflection intensity will oscillate, and each compl…

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