14.2k citations
- Centre National de la Recherche ScientifiqueFR405 papers
- Université de RennesFR324 papers
- Université Rennes 1FR150 papers
- Observatoire de ParisFR120 papers
- Commissariat à l'Énergie Atomique et aux Énergies AlternativesFR113 papers
- Observatoire de la Côte d’AzurFR111 papers
- Sorbonne UniversitéFR110 papers
- University of WarsawPL107 papers
- Université Paris-SudFR105 papers
- California Institute of TechnologyUS104 papers
- University of BirminghamGB101 papers
- Australian National UniversityAU96 papers
5 papers · 2 filters
Photoelectron diffraction of twisted bilayer graphene
S. Tricot, H. Ikeda, H. -C. Tchouekem +7
Photoelectron diffraction (PED) is a powerful spectroscopic technique that combines elemental resolution with a high sensitivity to the local atomic arrangement at crystal surfaces…
Multiscale approach for modeling magnetization properties of inhomogeneous ultrathin magnetic layers
Julien Mordret, Jean-Christophe Le Breton, Gabriel Delhaye +3
We report on spin atomistic calculations used to model static and dynamic magnetic properties of inhomogeneous ultrathin iron films. Active magnetic layers in next-generation spint…
Two-dimensional to bulk crossover of the WSe electronic band structure
Patrick Le Fèvre, Raphaël Salazar, Matthieu Jamet +8
Transition Metal Dichalcogenides (TMD) are layered materials obtained by stacking two-dimensional sheets weakly bonded by van der Waals interactions. In bulk TMD, band dispersions…
Electronic Properties of Electroactive Ferrocenyl-Functionalized MoS2
Trung Nghia Nguyên Lê, Kirill Kondratenko, Imane Arbouch +6
The attachment of redox active molecules to transition metal dichalcogenides (TMDs), such as MoS2, constitutes a promising approach for designing electrochemically switchable devic…
Van der Waals epitaxy of Weyl-semimetal Td-WTe
Alexandre Llopez, Frédéric Leroy, Calvin Tagne-Kaegom +13
Epitaxial growth of WTe offers significant advantages, including the production of high-qualityfilms, possible long range in-plane ordering and precise control over layer thick…