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most citedPhoton number resolution using a time-multiplexed single-photon detector

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cond-mat.mtrl-sci2009

Characterizing Voltage Contrast in Photoelectron Emission Microscopy

Vinod K. Sangwan, Vincent W. Ballarotto, Karen Siegrist +1

A non-destructive technique for obtaining voltage contrast information with photoelectron emission microscopy (PEEM) is described. Samples consisting of electrically isolated metal…