most citedSTEM image analysis based on deep learning: identification of vacancy defects and polymorphs of

47 citations

researchers with a paper here
collaborating institutions

2 papers

cond-mat.mes-hall2022★ 47 cited

STEM image analysis based on deep learning: identification of vacancy defects and polymorphs of

Kihyun Lee, Jinsub Park, Soyeon Choi +9

Scanning transmission electron microscopy (STEM) is an indispensable tool for atomic-resolution structural analysis for a wide range of materials. The conventional analysis of STEM…

cond-mat.mtrl-sci2021★ 11 cited

Single-Crystalline Metallic Films Induced by van der Waals Epitaxy on Black Phosphorus

Yangjin Lee, Han-gyu Kim, Tae Keun Yun +11

The properties of metal-semiconductor junctions are often unpredictable because of non-ideal interfacial structures, such as interfacial defects or chemical reactions introduced at…