most citedDielectric Tensor of CrSBr from Spectroscopic Imaging Ellipsometry

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physics.optics2025

Unambiguous determination of optical constants and thickness of ultrathin films by using optical anisotropic substrates

Sebastian Schaper, Matthias Duwe, Ursula Wurstbauer

The unambiguous and universal determination of optical constants such as complex refractive indices (n, k) and thickness (d) in one measurement is typically confined for films with…