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19932026
most citedGaia Data Release 2. Summary of the contents and survey properties

8.6k citations

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Showing 2005 · cond-mat.mtrl-sciShow all

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cond-mat.mtrl-sci2005

Stress-enhanced ion diffusion at the vicinity of a crack tip as evidenced by atomic force microscopy in silicate glasses

F. Celarie, M. Ciccotti, C. Marliere

The slow advance of a crack in sodo-silicate glasses was studied at nanometer scale by in situ and real time atomic force microscopy (AFM) in a well controlled atmosphere. An enhan…

cond-mat.mtrl-sci2005★ 74 cited

Electron diffraction analysis of individual single-walled carbon nanotubes

Jannik C. Meyer, Matthieu Paillet, Georg S. Duesberg +1

We present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight indiv…